MMS 2007 INTERNATIONAL TECHNICAL PROGRAMME COMMITTEE
Balanis, C. A. (Arizona State University, USA); Belkebir, K. (Insitute Fresnel, Marseille, France); Berceli, T. (Budapest University of Techn. and Econ., Hungary); Bouallegue, A. (LST, ENIT, Tunis); Cevini, G. (University of Pavia, Italy); Caorsi, S. (University of Pavia, Italy); Chang, K. (Texas A&M University, USA); Christopoulos, C. (University of Nottingham, UK); Costa Freire, J. (IT/IST Lisbon, Portugal); Di Massa, G. (University of Calabria, Italy); El-Ghazaly, S. M. (University of Tennessee, USA); Essaaidi, M. (Abdelmalek Essaaidi University, Morocco); Fouad Hanna, V. (University Paris VI, France); Fusco, V. F. (The Queen's University of Belfast, UK); Gardiol, F. (EPFL, Switzerland); Gupta, K. C. (University of Colorado at Boulder, USA); Gurel, L. (Bilkent University, Turkey); W. Hoefer, W. (University of Victoria, Canada); Itoh, T. (University of California, USA); Kolumban, G. (Budapest University of Techn. and Econ., Hungary); Koussai Kayali, A. (University of Halab, Syrie); Landesa, L. (Universidad de Extremadura, Spain); Leviatan, Y. (Technion-Israel Institute of Technology, Israel); Luy, J. F. (Daimler Chrysler, Germany); Madjar, A. (Temple University, USA); Mosig, J. R. (EPFL, Switzerland); Omar, A. S. (University of Magdeburg, Germany); Pastorino, M. (University of Genoa, Italy); Salazar-Palma, M. (Universidad Carlos III de Madrid, Spain); Salem, I. (Technical College, Cairo, Egypt); Sheirah, M. A. (Ain Shams University, Cairo, Egypt); Sorrentino, R. (University of Perugia, Italy); Stratakos, Y. (ICCS, Athens, Greece); Uzunoglu, N. (National Technical University of Athens, Greece); Volakis, J. L. (Ohio State University, USA)
12th MICROCOLL INTERNATIONAL TECHNICAL PROGRAMME COMMITTEE
Aitchison, C.S. (University of Surrey, England, U.K.) Berceli, T. (Budapest Univ. of Techn. and Econ., Hungary); Beyer, A. ( Gerhard Mercator University Duisburg-Essen, Germany) ; Cabon, B. (Institut National Polytechnique de Grenoble, France); Capmany, J. (Polytechnic University of Valencia, Spain); Daryoush, A.S. (Drexel University, USA); Frigyes, I. (Budapest Univ. of Techn. and Econ., Hungary); Géher, K. (Budapest Univ. of Techn. and Econ., Hungary); Gwarek, W.K. (Warsaw University of Technology, Poland); Herczfeld, P.R. (Drexel University, USA); Hoefer, W. (University of Victoria, Canada); Hristov, H.D. (UTFSM, Chile); Itoh, T. (UCLA, University of California, USA); Izutsu, M. (National Inst. of Information and Comm. Technology, Japan); Jäger, D. (Gerhard Mercator Universität Duisburg-Essen, Germany); Kolumban, G. (Budapest Univ. of Techn. and Econ., Hungary); Kitayama, K. (University of Osaka, Japan); Ligthart, L. (University of Delft, The Netherlands); Lyubchenko, V. Institute of Radioengineering & Electronics, Russia); Madjar, A. (Temple University, USA); Marti, J. (Polytechnic University of Valencia, Spain); Minasian, R. (The University of Sydney, Australia); Modelski, J. (Warsaw University of Technology, Poland); Nagy, L. (Budapest Univ. of Techn. and Econ., Hungary); Neic, A. (Institute of Applied Physics, Yugoslavia); Novak, D. (The University of Melbourne, Australia); Pap, L. (Budapest Univ. of Techn. and Econ., Hungary); Raida, Z. (University of Brno, Czech Republic); Räisänen, A. (Helsinki University of Technology, Finnland); Rizzoli, V., (Universita degli Studi di Bologna, Italy); Rosen, A. (Drexel University, USA); Rumelhard, Ch. (CNAM, France); Salazar Palma, M. (Universidad Carlos III de Madrid, Spain); Schünemann, K. (Technische Universität Hamburg-Harburg, Germany); Sallai, G. (Budapest Univ. of Techn. and Econ., Hungary); Seeds, A.J. (University College London, England, U.K); Sorrentino, R. (University of Perugia, Italy); Tóth, T. (Totaltel Co., Hungary); Vander Vorst, A. (Université Catholique de Louvain, Belgium); Wiesbeck, W. (University of Karlsruhe, Germany); Zombory, L. (Budapest Univ. of Techn. and Econ., Hungary)
|
top of page
